Search results for "event accumulation"

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A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

2015

A methodology is proposed for the statistical analysis of memory radiation test data, with the aim of identifying trends in the single-even upset (SEU) distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions.

Computer sciencebitmap slicingParallel computingHardware_PERFORMANCEANDRELIABILITYRadiationSlicingUpsetElectronic mailSuperposition principleStatic random-access memoryMemoriesstatic testNuclear Experimentdynamic testta114ta213computer.file_formatSRAMBitmap[SPI.TRON]Engineering Sciences [physics]/ElectronicsMultiple Cell Upset (MCU)MCUSERBitmapradiation testevent accumulationSingle Event Upset (SEU)AlgorithmcomputerSEUTest data
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